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Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination

Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination

Hardcover

Series: Springer Tracts in Modern Physics, Book 179

Medical ReferenceAstronomy & SpacePhysics

ISBN10: 3540434437
ISBN13: 9783540434436
Publisher: Springer
Published: Sep 11 2002
Pages: 214
Weight: 1.11
Height: 0.56 Width: 6.14 Depth: 9.21
Language: English
A new materials characterization methods, anomalous X-ray scattering, is presented in this book.

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