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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

Paperback

Technology & EngineeringGeneral SciencePhysics

ISBN10: 0367446804
ISBN13: 9780367446802
Publisher: CRC Press
Published: Jun 30 2020
Pages: 368
Weight: 1.10
Height: 0.90 Width: 6.00 Depth: 8.90
Language: English
Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the

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