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Analysis of Particulate Contamination on Tape Lift Samples from the Veta Optical Surfaces

Analysis of Particulate Contamination on Tape Lift Samples from the Veta Optical Surfaces

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Astronomy & Space

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ISBN10: 1729172008
ISBN13: 9781729172001
Publisher: Independently Published
Published: Oct 24 2018
Pages: 28
Weight: 0.20
Height: 0.06 Width: 8.50 Depth: 11.00
Language: English
Particulate contamination analysis was carried out on samples taken from the Verification Engineering Test Article (VETA) x-ray detection system. A total of eighteen tape lift samples were taken from the VETA optical surfaces. Initially, the samples were tested using a scanning electron microscope. Additionally, particle composition was determined by energy dispersive x-ray spectrometry. Results are presented in terms of particle loading per sample. Germani, Mark S. Unspecified Center NASA ORDER H-11942-D...

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